CdTe and CIGS on Glass

Problem:

CdTe and CIGS are the dominant thin film PV production methods. Both processes require the scribing of a clear TCO coating followed by application of semiconductor coating and subsequent P2 and P3 scribing. NxtGen systems are employed for 100% inspection of the P1, P2 and P3 scribes, scribe widths and scribe offsets as well as detection of coating defects.

Solutions:

Special Dark Field optics provide 100% real-time inspection of ALL the P1, P2 and P3 scribes. Extraordinary NxtGen processing and algorithms detect departures from allowable scribe width and scribe pitch while concurrently detecting defects in the scribes.

P1 Scribes:

P2 Scribes:

P3 Scribes:

Semiconductor Coatings: