CdTe and CIGS on Glass
 

CdTe and CIGS are the dominant thin film PV production methods. Both processes require the scribing of a clear TCO coating followed by the application of a semiconductor coating and subsequent P2 and P3 scribing.  NxtGen™ systems are employed for 100% inspection of the P1, P2 and P3 scribes, scribe widths and scribe offsets as well as detection of coating defects.

Special Dark Field optics provide 100% real-time inspection of ALL the P1, P2 and P3 scribes. Extraordinary NxtGen™ processing and algorithms detect departures from allowable scribe width and scribe pitch while concurrently detecting defects in the scribes.

P1 Scribes:

P2 Scribes:

P3 Scribes:

Semiconductor Coatings:

 

NxtGen

Dark Field Technologies, reknown for its innovative laser/camera metrology systems, introduces NxtGen™, the most versatile system ever conceived.