Unique system capabilities

 

The architecture is unique; NxtGenTM supports laser, camera, hybrid laser: cameras, telecentric and divergent optics and retro-reflection. For example,

  • 100% inspection of P1, P2 and P3 Scribes and offsets.
  • Patent pending Variable Field Scanners deliver extraordinary sub-pixel detection.
  • Integrated metrology scanners provide warp and profile measurement.
  • Panel Length, Width and Squareness measurement.
  • Extraordinary signal processing capacity: Solar panel inspection – over 500 million pixels in three seconds.
  • Patent pending optics derived from laser scanners, utilized in a solid state design with no moving parts; 100% self aligning.

In short, NxtGenTM is the most versatile system ever conceived. And, it has been designed to deliver the highest performance at the lowest cost, in the market.


NxtGenTM metrology provides 100% on-line, real-time defect mapping, imaging and classification.