Unique System Capabilities

The architecture is unique; NxtGen™ supports laser, camera, hybrid laser: cameras, telecentric and divergent optics and retro-reflection. For example,

100% inspection of P1, P2 and P3 Scribes and offsets.

Patent pending Variable Field Scanners deliver extraordinary sub-pixel detection.

Integrated metrology scanners provide warp and profile measurement.

Panel Length, Width and Squareness measurement.

Extraordinary signal processing capacity: Solar panel inspection – over 500 million pixels in three seconds.

Patent pending optics derived from laser scanners, utilized in a solid state design with no moving parts; 100% self aligning.

In short, NxtGen™  is the most versatile system ever conceived. And, it has been designed to deliver the highest performance at the lowest cost, in the market.

NxtGen™ metrology provides 100% on-line, real-time defect mapping, imaging and classification.