Unique system capabilities

The architecture is unique; NxtGen^TM supports laser, camera, hybrid laser: cameras, telecentric and divergent optics and retro-reflection. For example,

• 100% inspection of P1, P2 and P3 Scribes and offsets.
• Patent pending Variable Field Scanners deliver extraordinary sub-pixel detection.
• Integrated metrology scanners provide warp and profile measurement.
• Panel Length, Width and Squareness measurement.
• Extraordinary signal processing capacity: Solar panel inspection – over 500 million pixels in three seconds.
• Patent pending optics derived from laser scanners, utilized in a solid state design with no moving parts; 100% self aligning.

In short, NxtGen^TM is the most versatile system ever conceived. And, it has been designed to deliver the highest performance at the lowest cost, in the market.

NxtGen^TM metrology provides 100% on-line, real-time defect mapping, imaging and classification.